REF-1161

CWE
An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs

Citation

Authors
Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede
Title
An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs
Publication
2011 Workshop on Fault Diagnosis and Tolerance in Cryptography (IEEE)
Year
2011
Source catalog
MITRE CWE
View original document